Complex evaluation of compact testing of digital circuits based on minimal polynomials.
Dyachenko V.O., Dyachenko O. N.
The efficiency of compact testing of digital circuits is analyzed under assumption that the test sequence generator and test response analyzers are LFSR with minimal generator polynomials. On the basis of such analysis, a complex evaluation is proposed for various combinations of minimal generator polynomials for exhaustive testing of combinational circuits.Keywords: minimal polynomials, test sequence generator, test response analyzer, generator polynomial.
