Application of methods of antinoise coding for compact testing of digital circuits.
Dyachenko O. N., Zinchenko Y.E., Dyachenko V. O.
The efficiency of compact testing of combinational circuits that takes into account the structure of the generator of test sequence, analyzer of test reactions based on the methods of cyclic encoding and the distribution of errors in a test response, under study. The calculation method signatures differ from the well-known in the selection of a power notation of test cases instead of binary is proposed. It is shown that the main advantage of the analytical evaluation of the signatures are not so much values compact evaluations, and the conclusion of signature testability of combinational circuits. This conclusion is extended to multi-analyzers test reactions; for structures with symbol-by-symbol interleaving; for the generator polynomials, in Galois configuration and the configuration of the Fibonacci. Recommendations on the choice of the generator polynomials of linear feedback shift register for different variants of compact testing are proposed.Keywords: Generator of test sequences, analyzer of test reactions, linear feedback shift register, generator polynomial, cyclic codes.
